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NIR Stress Birefringence Detection Equipment
Applications
| NIR-near-infrared | Infrared equipment processing or assembly |
| Raw material factory |
Working Principle
Rapidly measure and analyze the birefringence/residual stress distribution of NIR materials, freely analyze quantitative
data such as phase difference distribution graphs on any line and average value in any area.
Features
| Model | SBD-NIR-X—X |
| Working Mode | Real-time measurement |
| Function | Stress magnitude, stress distribution |
| Detection wave band | VIS-520nm, 590nm, 650nm |
| Test range | 1~110nm& 1~280nm |
| Spatial resolution | 0.05mm |
| Test repeatability | 0.1nm |
| Measurement frequency | >15FPS |
| Note: Customized production available. | |
Detection Images
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