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ZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect Detection

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ZEIT Group
City:chengdu
Province/State:sichuan
Country/Region:china
Contact Person:MsTyra
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ZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect Detection

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Brand Name :ZEIT
Model Number :S1200- 150
Certification :Case by case
Place of Origin :Chengdu, P.R.CHINA
MOQ :1set
Price :Case by case
Payment Terms :T/T
Supply Ability :Case by case
Delivery Time :Case by case
Packaging Details :Wooden case
Size :820mm*700mm*760mm, Customizable
Customizable :Available
Guarantee period :1 year or case by case
Shipping Terms :By Sea / Air / Multimodal Transport, etc
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View Product Description

Structural Light Large Size Surface Shape Detection Equipment

Applications

Lamp reflector shape detection; wafer flatness detection; car paint surface detection; lens surface shape detection.

Working Principle

The display projects the structured light in stripe form, and the camera collects the structured light from the measured

surface, the collected stripe is deformed through the modulation of the measured surface, the point cloud distribution

and curvature distribution of the measured surface are calculated according to the deformation of the stripe, then the

surface shape error distribution can be obtained by comparing point cloud distribution with ideal model.

Features

Model SI200-150
Measuring range 200×150mm2
Transverse resolution Conventional 0.25mm, adjustable
Measuring precision Absolute error: ±3μm (100mm in diameter)
Note: Customized production available.

Detection Image

ZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect Detection

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ZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect Detection

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