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Semiconductor Surface Detector Systems Optical Testing Equipment 40x

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ZEIT Group
City:chengdu
Province/State:sichuan
Country/Region:china
Contact Person:MsTyra
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Semiconductor Surface Detector Systems Optical Testing Equipment 40x

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Brand Name :ZEIT
Model Number :SDD0.5-0.5
Certification :Case by case
Place of Origin :Chengdu, P.R.CHINA
MOQ :1set
Price :Case by case
Payment Terms :T/T
Supply Ability :Case by case
Delivery Time :Case by case
Packaging Details :Wooden case
Size :1210 mm*1000mm* 1445mm, Customizable
Customizable :Available
Guarantee period :1 year or case by case
Magnification :40x
Detectable defect type :Scratches, Dusts
Resolution :1.8μm
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Semiconductor Surface Detector Systems Optical Testing Equipment 40x

Applications

For the process control and yield management of blank mask in the fields of semiconductor display and

integrated circuit chip manufacturing, we use high throughput optical testing technologies to make fast and

accurate automatic detection for the surface defects of blank mask. According to professional user needs,

we have developed series of high throughput MASK inspection machines with reliable quality and high cost

performance ratio, to help glass substrate, mask and panel manufacturers to identify and monitor the mask

defects, reduce the risk of yield and improve their independent ability of R&D for core technologies.

Working Principle

With regards to level and type of surface defect, 4x telecentric lens, specific angle ring light and coaxial light

source are selected as the visual approach. When the device is running, the sample moves along the X

direction and the vision module carries out defect detection along the Y direction.

Features

Model SDD0.5-0.5

Performance detection

Detectable defect type Scratches, Dusts
Detectable defect size 1μm

Detection accuracy

(measured)

100% detection of defects / collection of

defects (scratches, dust)

Detection efficiency

≤10 minutes

( Measured value : 350mm x 300mm Mask)

Optical System Performance

Resolution 1.8μm
Magnification 40x
Visual field 0.5mm x 0.5mm
Blue light illumination 460nm,2.5w

Motion Platform Performance

X, Y two-axis motion

Marble countertop flatness: 2.5μm

Y-axis Z-direction runout precision: ≤ 10.5μm

Y-axis Z-direction runout precision: ≤8.5μm

Note: Customized production available.

Detection Images

Semiconductor Surface Detector Systems Optical Testing Equipment 40x

Our Advantages

We are manufacturer.

Mature process.

Reply within 24 working hours.

Our ISO Certification

Semiconductor Surface Detector Systems Optical Testing Equipment 40x

Parts Of Our Patents

Semiconductor Surface Detector Systems Optical Testing Equipment 40xSemiconductor Surface Detector Systems Optical Testing Equipment 40x

Parts Of Our Awards and Qualifications of R&D

Semiconductor Surface Detector Systems Optical Testing Equipment 40xSemiconductor Surface Detector Systems Optical Testing Equipment 40x

ZEIT Group, founded in 2018, is a company focused on precision optics, semiconductor materials and high-tech intelligence equipments. Based on our advantages in precision machining of core and screen, optical detection and coating, ZEIT Group has been providing our customers with complete packages of customized and standardized product solutions.

Concentrated on technological innovations, ZEIT Group has more than 60 domestic patents by 2022 and established very close enterprise-college-research cooperations with institutes, universities and industrial association worldwide. Through innovations, self-owned intellectual properties and building up the key process experimental teams, ZEIT Group has become a development base for incubating high-tech products and a training base for high-end personnels.

Semiconductor Surface Detector Systems Optical Testing Equipment 40x

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